JEOL USA is pleased to
announce that a new Cold Field Emission Gun is now available for the atomic
resolution analytical JEM-ARM200F Transmission Electron Microscope (TEM). The
ARM200F, introduced in 2009, has set a new benchmark for advanced
aberration-corrected S/TEM technology with the highest resolution commercially
available in its class.
Now outfitted with the optional and field-retrofittable Cold FEG, the
ARM200F's ultrahigh imaging resolution is guaranteed at 78 picometers with an
energy resolution of 0.3 eV. The higher brightness and smaller source size of
the Cold FEG produce a smaller, sharper electron probe with a dramatically
larger probe current, resulting in enhanced atom-by-atom imaging and chemical
analysis. Additionally, the narrow energy spread of the electrons emitted from
the Cold FEG enables atomic resolution analysis of EELS fine structures, which
can be used to determine such things as electronic properties. Ultra-high vacuum
near the electron source assures high stability of the electron probe current
while high electrical system stability of 10-7 maintains the very narrow energy
spread of the electron probe.
"The addition of a cold FEG to the ARM family adds another arrow to the JEOL
quiver for atomic scale imaging and characterization. This enhancement makes it
possible to perform sub-Angstrom imaging and atomic column chemistry with
accuracy, speed and ease never seen before," said Dr. Thomas Isabell, Director
of the TEM Product Division at JEOL USA.
The JEOL ARM200F electron column
integrates the Cold FEG, S/TEM and Cs correction in an unparalleled,
ultra-stable design. Superior shielding safeguards the ultrahigh-powered optics
from airflow, vibration, acoustical, magnetic, electronic, and thermal
The first ARM200F with Cold FEG in the USA will be installed at Florida State
University's Applied Superconductivity Center, housed in the National High
Magnetic Field Laboratory.