JEOL announces a major
order for the company's atomic resolution analytical JEM-ARM200F Transmission
Electron Microscope (TEM), from the National Institute of Standards and Technology
(NIST). The purchase was made through a competitive award process and funded
by the American Recovery and Reinvestment Act. The TEM will be a featured instrument
in the NIST Precision Measurement Laboratory, Boulder, Colorado.
"We are very excited to be partnering with this premier Federal government
facility and are confident the opportunity will recognize the high performance
capability of this new TEM platform," said Peter Genovese, JEOL USA President.
“We believe having hands-on access will open up unexplored horizons and
world-class results for the scientific team who will be using it.”
The ARM200F, introduced in 2009, has set a new benchmark for advanced aberration-corrected
S/TEM technology with the highest resolution (78pm) commercially available in
its class. The instrument represents more than 60 years of TEM expertise at
JEOL and was designed from the ground up to integrate aberration correction
into a super-shielded electron column that safeguards the ultrahigh-powered
optics from environmental interferences.
JEOL is a world leader in electron optical equipment and instrumentation for
high-end scientific and industrial research and development. Core product groups
include electron microscopes (SEMs and TEMs), instruments for the semiconductor
industry (electron beam lithography and a series of defect review and inspection
tools), and analytical instruments including mass spectrometers, NMRs and ESRs.
JEOL USA, Inc., is a wholly owned subsidiary of JEOL, Ltd., Japan, was incorporated
in the United States in 1962. The company has 13 regional service centers that
offer unlimited emergency service and support in the U.S.