JEOL offers a whole
new electron microscope experience with the introduction of the InTouch Scope™,
an analytical, low vacuum Scanning Electron Microscope (SEM) featuring integrated
Energy Dispersive Spectroscopy (EDS) with the latest Silicon Drift Detector
The new InTouch Scope has the familiar feel of today’s personal electronic
media. The intuitive multi-touch screen interface puts all SEM “Apps”
at the operator’s fingertips. The user can expand windows and images with
the sweep of two fingers, dial in magnification and focus with a swipe, and
select operating parameters, analytical functions, or measure distances just
by tapping the PC or notebook touch screen.
Ease of use is a key feature of all JEOL SEMs, and the versatile InTouch Scope
has functions that users of all levels will appreciate:
- automatic SEM condition setup based on sample type
- simultaneous multiple live image and movie capture
- easy sample navigation at 5x – 300,000x magnifications
- quantitative and qualitative elemental analysis
- low and high vacuum operation
- Wireless capability.
The In-Touch Scope features all the capabilities of a full size tungsten SEM
with integrated EDS analysis in a small, ergonomic and intuitive design. An
onboard turbo pump make this a truly self-contained, portable SEM that is easy
to set up anywhere in the lab.
JEOL is a world leader in electron optical equipment and instrumentation for
high-end scientific and industrial research and development. Core product groups
include electron microscopes (SEMs and TEMs), instruments for the semiconductor
industry (electron beam lithography and a series of defect review and inspection
tools), and analytical instruments including mass spectrometers, NMRs and ESRs.
JEOL USA, Inc., is a wholly owned subsidiary of JEOL, Ltd., Japan, was incorporated
in the United States in 1962. The company has 13 regional service centers that
offer unlimited emergency service and support in the U.S.