LOT are offering demonstrations of the Park XE-100 AFM at our offices in Leatherhead between Wednesday 11th May and Friday 13th May. This is an ideal opportunity to see the XE-100 and meet technical experts from Park Systems.
The XE-100 is our flagship AFM with reduced drift rate and the Step-and-Scan Automation that provides the ultimate AFM/SPM performance in Non-Contact nanoscale metrology. It is a mid-priced system for materials science, polymers, electrochemistry and other applications in nanoscience and engineering. It can adopt a wide range of optical coupling with its open side access.
To book your demonstration please contact Angela Carslake on 01372 378822, e-mail firstname.lastname@example.org or go to our website www.lotoriel.co.uk