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Posted in | Nanoanalysis

Small-angle X-ray Scattering Measurements for Nano-particle Analysis

Published on April 30, 2011 at 5:51 AM

By Cameron Chai

PANalytical has unveiled a new hardware and software for small-angle X-ray scattering (SAXS) measurements on its X-ray diffraction (XRD) systems called EasySAXS v2.0.

EasySAXS v2.0 can be used for multiple purposes and is suitable for the Empyrean and X’Pert Powder. It is user friendly and delivers enhanced data. The SAXS capability enhances the existing PANalytical’s diffractometers. The EasySAXS v2.0 will enable SAXS and nanoparticle analysis.

Small-angle X-ray scattering (SAXS) is a multi-pronged method for structural analysis of solid and liquid materials in the 1-100nm range. It can be applied to crystalline and amorphous nanomaterials. It can be used in applications such as analyses of nanoparticle or pore sizes distribution, particle shapes and nanostructures.

It provides additional data to X-ray diffraction, called wide-angle X-ray scattering (XRD, WAXS), applied in crystalline phase for qualitative and quantitative analysis in a material. The system provides platforms suitable for multiple purposes.

The sample stage does not need alignment of samples by users. The stage can be attached and the prepared sample inserted. It is available with sample holders and preparation equipment for liquids, powders, and thin solids. It utilizes disposable quartz capillaries to enable liquid sample measurement. Also available is an adjustable precision SAXS anti-scatter slit attachment to increase the limits of low-angle resolution, while a semi-transparent beamstop accelerates low-angle diffraction measurements.

Source: http://www.panalytical.com

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