Nanosurf Announce AFM Webinar for Surface Inspection and Defect Analysis

Published on April 24, 2012 at 4:25 AM

The Nanosurf LensAFM is an atomic force microscope (AFM) that may be used in conjunction with almost any upright optical microscope or optical profilometer. The combined LensAFM/optical platform provides a complementary imaging system that greatly extends the resolution and measuring capabilities of these individual instruments.

The Nanosurf LensAFM.

This webinar will highlight:

  • Ease of adaptation with multiple optical platforms
  • Synergy and convenience of combining optical and 3D topographical information in the same place
  • Examples of industrial applications that have benefited from the combined platform


  • Roughness Measurements, Defect Analysis, Edge Radius, Step Heights
  • Material Properties: Hardness, wear analysis, Conductance/Resistance, Magnetism

Who Should Attend:

  • Quality Assurance Professionals, Engineers, and Management
  • Those interested in non-destructive testing
  • Research and Development Teams
  • Academic Staff/Students

Register Free at

Please retain the following password: Nsf*123. It will be required to join the webinar.

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