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Posted in | Microscopy

Delong America Introduces Atomic Force Microscopy Tip Holder for LVEM5 Electron Microscope

Published on October 26, 2012 at 6:54 AM

Delong America is proud to announce 2 new accessories for the LVEM5 benchtop electron microscope.

LVEM5 Benchtop Electron Microscope

Tilt Holder
The tilt holder is capable of ±15° of tilt, or a total of 30° of tilt. This holder is compatible with all imaging modes (TEM, SEM & STEM). It can be used for Electron Tomography or Photogrammetry to obtain detailed 3D structures from 2D images.

For more details please visit the new Tilt Holder Page on our website.

AFM Tip Holder
Atomic Force Microscopy (AFM) relies on a cantilever with a sharp tip (probe) that is used to scan the surface of a sample. AFM tips generally have a radius of curvature of around a few nanometers. With the addition of the new AFM tip Holder, The LVEM5 is now capable of accepting AFM tips as samples. Tip shape and sharpness can easily be measured in both TEM and SEM modes. This versatility, paired with rapid sample exchange, is a strong advantage for quality assurance inspection associated with the production of AFM probes.

For more details please visit the new AFM Tip Holder Page on our website.

LVEM5 Benchtop Electron Microscope
The LVEM5 is the next generation of electron microscope, built on a revolutionary technology platform that combines advanced imaging with unparalleled benchtop convenience. The LVEM5 is the smallest multi-mode desktop electron microscope on the market today.

The clever build of the LVEM5 is it's compact, truly desktop design. It can accommodate up to 4 imagining modes (TEM, STEM, SEM, and electron diffraction) and allows for effortless transitioning between modes. The operations of the LVEM5 are straightforward, and routine procedures such as column alignment don't require unreasonable effort and time. Downtime is further minimized by quick sample exchange.

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