Posted in | Microscopy | Nanoanalysis

Hitachi's Premium SU3500 VP-SEM Now Available with 4-Axis Motorized Stage for Smaller Samples

Published on January 9, 2014 at 6:01 AM

The Nanotechnology Systems Division of Hitachi High Technologies America, Inc. announced that its latest VP-SEM system, Model SU3500, is now available with a 4-axis motorized stage, in addition to the existing 5-axis motorized stage system.

The new 4-axis version is targeted for smaller sample applications (max. 200 mm in diameter and 70 mm in height).

The 4-axis motorized stage system features the same innovative electron optics and signal detection systems as the 5-axis motorized stage system, providing unparalleled 3-D imaging and analytical performance.

The SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance. Designed with intuitive logic, the new user-friendly GUI provides comprehensive image observation and display functions.

Engineered for a wide range of applications, including biological specimens and advanced materials, the SU3500 is sure to be the workhorse microscope in any laboratory.

About Hitachi High Technologies America (HTA), Nanotechnology Systems Division

Hitachi High Technologies America, Inc., headquartered in Schaumburg, Illinois, is a North American Division of Hitachi High Technologies, Tokyo, Japan.  Hitachi has sold and supported its instruments in the U.S. market for over 40 years.  HTA comprises many divisions, including the Nanotechnology Systems Division, headquartered in Clarksburg, Maryland.  The Nanotechnology Systems Division provides technologically advanced solutions to meet the diverse and complex challenges of materials science, biological research, and industrial manufacturing.  We support our satisfied customers with a wide range of reliability-proven instrumentation, including scanning electron microscopy (SEM), analytical and biological transmission electron microscopy (TEM), dedicated STEM, Focused Ion Beam (FIB), tabletop microscopes, and microanalysis sample preparation systems.

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