M Optomechanical, Inc., has introduced a new version of its
3D MEMS Optical Profiler that has been specifically configured to meet
the needs of educational institutions. Known as the OPTOPro Model
622-EDU, the Profiler is based on a patented technology, called
long-working distance interference microscopy. The Model 622-EDU is
intended primarily for use by educators for training students to make
real-time dynamic measurements of the micro- and nano-scale motions of
micro-electro-mechanical systems (MEMS) devices and other microsystems.
The Model 622-EDU was developed because there were no
commercial optical profilers priced in a range suitable for educators
to use as a teaching tool. "The Model 622-EDU is a valuable research
tool as well and can be upgraded to the level of our flagship Model
622-A," says Tom Swann, president of EMOM.
The profiler instrument is controlled by EMOM's MEMScript
Software that also acquires and analyzes the data collected. This
software has several unique features, such as the ability to control
microsystem devices, which by nature have moving parts, and making real
time measurements of performance. "Scripts," which control the OPTOPro,
together with additional teaching materials and a micro-device to be
used as a test sample are included with the Model 622-EDU.
The Central New Mexico Community College (CNM) Southwest
Center for Microsystems Education, has acquired the first EMOM Profiler
to be used as a part of a program where the specific objective is "to
educate students at the community college and high school level in
microsystems", says Al West of CNM.