Site Sponsors
  • Technical Sales Solutions - 5% off any SEM, TEM, FIB or Dual Beam
  • Strem Chemicals - Nanomaterials for R&D
  • Oxford Instruments Nanoanalysis - X-Max Large Area Analytical EDS SDD
  • Park Systems - Manufacturer of a complete range of AFM solutions

FEI Selects Shimadzu as Sales Agent for Japan

Published on June 4, 2008 at 11:11 AM

FEI Company, a leading provider of high-resolution imaging and analysis systems, announced today that it has selected Shimadzu Corporation, developer of analytical measuring and technology systems, as a sales agent in Japan. Shimadzu, located in Kyoto, Japan, will sell FEI systems, including Quanta™ and Inspect™ scanning electron microscopes (SEMs) and the Quanta 200 3D small-stage DualBeam™ focused ion beam/scanning electron microscopes (FIB/SEM), to its established base of customers in Japan.

“Shimadzu Corporation is a prominent pioneer of analytical measurement and technology in Japan, and we are very proud to enter into this agreement in which they will provide sales for FEI Quanta and Inspect systems in the region,” said Benjamin Loh, FEI’s executive vice president of global sales and service. “We look forward to expanding our market share in Japan by leveraging Shimadzu’s well-established distribution network and customer base.”

Osamu Ando, general manager of Shimadzu’s Analytical and Measuring Instruments Division, commented, “We feel that adding the FEI SEM and DualBeam systems to our current line-up of product offerings will benefit our customers in Japan immensely, as they will have one source for their analytical measurement and imaging needs for applications ranging from basic research to quality control.”

Shimadzu Corporation offers a wide range of products for surface analysis and measurement, including electron probe microanalyzers, scanning probe microscopes, confocal laser scanning microscopes and x-ray photoelectron spectrometers.

Tell Us What You Think

Do you have a review, update or anything you would like to add to this news story?

Leave your feedback
Submit