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Semiconductor Measurement System from Keithley Receives 'Best Product Award'

Published on August 27, 2008 at 2:38 PM

Keithley Instruments, Inc., a leader in solutions for emerging measurement needs, announces that it has been awarded the prestigious Editor's Choice Best Product Award from Semiconductor International magazine for its Model 4200-CVU Semiconductor Measurement System, which is used to make fast and easy C-V (Capacitance-Voltage) measurements.

The annual awards "find and reward the products created by companies that deliver the level of excellence needed to succeed" in the semiconductor industry, according to the magazine.

"C-V measurements are becoming a critical part of research and development in the semiconductor industry," said Mark Hoersten, Keithley vice president business development. "Keithley's Model 4200-CVU is a fast and easy measurement instrument that is vital for product developers and researchers facing the challenges of characterizing new semiconductor materials for next-generation electronic devices such as smart phones, laptops, and other electronic devices."

The awards were presented at a special ceremony on July 16th during the SEMICON West trade show in San Francisco.

For More Information. For more information on Keithley's Model 4200-CVU or any of its semiconductor test systems, visit www.keithley.com/products/semiconductor/?mn=4200-CVU or contact the company at www.keithley.com.

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