Agilent Technologies announced today that it will collaborate with the Delft
University of Technology in the Netherlands to research large-signal and sub-mm-wave
characterization techniques.
"Agilent has been one of our biggest and most reliable supporters for
the past two decades," said Leo de Vreede, associate professor in the research
school of the Delft Institute for Microsystems and Nanoelectronics (DIMES).
"We share a common view on application-driven RF characterization tools
and use Agilent's software tools and instrumentation extensively in our education
and research programs."
With this new collaboration, enabled by the emerging SmartMix/MEMPHIS project,
there has been a tremendous acceleration in research activities and capabilities
at DIMES. This is evidenced by the creation of two complementary characterization
facilities: the RF and the sub-mm-wave DIMES characterization laboratories.
These new facilities will enable DIMES to continue to lead technological advancement
of devices, components and circuits into the sub-mm-wave frequency range.
"Delft University's leadership in RF characterization techniques for high-performance
RF and wireless applications has already received international recognition,"
said Roger Stancliff, chief technical officer, Components Test Division, Agilent
Technologies. "DIMES's expertise enriches our work and we are able to give
aspiring young scientists the opportunity to work with the latest equipment
in RF/microwave from Agilent."
The Large-signal and Sub-mm-wave Characterization Techniques seminar agenda
and registration information can be found at www.agilent.com/find/DIMES.