Veeco
Instruments Inc., a leading provider of instrumentation to the nanoscience
community, today introduced the Veeco Instruments Thermal Analysis (VITA(TM))
module for its industry leading line of Scanning Probe Microscopes (SPMs). VITA
technology advances nanoscale material identification by providing characterization
capabilities through nanoscale thermal analysis (nTA), scanning thermal microscopy
(SThM), and heated-tip AFM. Together these techniques enable the precise determination
of local transition temperatures as well as mapping of temperature and thermal
conductivity variations. The VITA accessory is compatible with Veeco's
Innova™, Caliber™, MultiMode®, and Dimension™ systems.
According to David Rossi, Vice President, General Manager, Veeco's Nano-Bio
AFM Business, "By marrying the power of traditional bulk thermal analysis
with the resolution of atomic force microscopy (AFM), VITA technology opens
the door to quantitative thermal nanoscale characterization, and ultimately
nanoscale material identification." VITA is applicable for quantitative
material characterization of a wide range of materials, from complex polymer
blends to coatings to pharmaceuticals.
Dr. Stefan Kaemmer, Manager of Veeco's Knowledge and Applications Group,
commented, "VITA technology was developed as part of Veeco's commitment
to innovation and building SPMs into comprehensive nanoscale characterization
tools, and is a continuation of our longstanding expertise in thermal property
mapping. We are able to fully exploit the industry's latest tip developments
to take a giant step forward in spatial resolution. Researchers with a need
for high-resolution thermal property measurements can now benefit from a full
suite of techniques while leveraging the industry-leading performance of our
AFMs."