Veeco Introduces Thermal Analysis Module for its Line of Scanning Probe Microscopes

Published on November 11, 2008 at 10:00 AM

Veeco Instruments Inc., a leading provider of instrumentation to the nanoscience community, today introduced the Veeco Instruments Thermal Analysis (VITA(TM)) module for its industry leading line of Scanning Probe Microscopes (SPMs). VITA technology advances nanoscale material identification by providing characterization capabilities through nanoscale thermal analysis (nTA), scanning thermal microscopy (SThM), and heated-tip AFM. Together these techniques enable the precise determination of local transition temperatures as well as mapping of temperature and thermal conductivity variations. The VITA accessory is compatible with Veeco's Innova™, Caliber™, MultiMode®, and Dimension™ systems.

According to David Rossi, Vice President, General Manager, Veeco's Nano-Bio AFM Business, "By marrying the power of traditional bulk thermal analysis with the resolution of atomic force microscopy (AFM), VITA technology opens the door to quantitative thermal nanoscale characterization, and ultimately nanoscale material identification." VITA is applicable for quantitative material characterization of a wide range of materials, from complex polymer blends to coatings to pharmaceuticals.

Dr. Stefan Kaemmer, Manager of Veeco's Knowledge and Applications Group, commented, "VITA technology was developed as part of Veeco's commitment to innovation and building SPMs into comprehensive nanoscale characterization tools, and is a continuation of our longstanding expertise in thermal property mapping. We are able to fully exploit the industry's latest tip developments to take a giant step forward in spatial resolution. Researchers with a need for high-resolution thermal property measurements can now benefit from a full suite of techniques while leveraging the industry-leading performance of our AFMs."

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