Keithley Instruments,
Inc. (NYSE: KEI), a leader in emerging measurement solutions, announces
ACS Basic Edition, characterization and curve tracer software for component
test applications. The latest addition to Keithley's powerful Automated Characterization
Suite (ACS) family, ACS Basic Edition, integrates with the industry's broadest
range of source-measure units, Keithley's SourceMeter® Instrument family.
ACS Basic Edition, paired with Keithley's proven line of SourceMeter Instruments,
replaces obsolete curve tracers with a solution that performs both basic curve
tracing as well as parametric test while providing significant cost breakthrough.
ACS Basic Edition is available immediately; to learn more, visit http://keithley.acrobat.com/acsbasic/.
Keithley's Cost Effective Component Test Solution Combines Dramatic Ease of Use With Powerful Curve Tracer Capabilities
Keithley first introduced its ACS integrated test systems in 2007 as highly
configurable, instrument-based systems for semiconductor characterization at
the device, wafer, or cassette level, offering unique measurement capability
with powerful and flexible automation-oriented software. Initial ACS systems
were designed for larger semiconductor lab applications that call for a probe
station and large-scale on-wafer test applications. ACS Basic Edition is targeted
for bench-top component test applications that don't require integrated probers
yet still need the measurement and software automation power provided by the
ACS platform.
Ease of Use and Software Simplicity
Unlike other test systems, ACS Basic Edition provides an extensive library
of pre-configured component test routines to shorten start-up time, reduce programming
code development and simplify the process of test. ACS Basic Edition combines
the ease of use of a curve tracer with the analytic capabilities of a parametric
analyzer. With ACS Basic Edition, anyone can test a semiconductor component
in seconds and compare the characteristic curves with reference curves immediately.
ACS Basic Edition provides a variety of tools that makes it simple to reconfigure
for different component types. The technician simply selects the graphical icon
of the desired component type and selects the desired test, and moments later
the characteristic curve is displayed. ACS Basic Edition performs with the ease
of use of a curve tracer, but also provides the tabular data in spreadsheet
form. This additional functionality is complemented by a "formulator"
that allows mathematical or parametric extractions to be performed on the raw
curve tracer data. This advanced capability means that parametric characterization
is as easy as using a curve tracer. In those cases when more than a single test
is needed, ACS Basic Edition provides a powerful multi-test capability that
allows the user to string together a number of different tests on a single device.
SourceMeter Instruments Provide ACS Basic's Measurement Performance
Keithley's System SourceMeter Instruments provide the source-measure power
behind ACS Basic Edition. ACS Basic Edition can be configured with any Series
2400, Series 2600, or Series 2600A instruments to provide high power or low-level
characterization, from a powerful 1kW pulse to a very sensitive 1fA measurement
resolution. When characterizing high power devices, ACS Basic Edition is typically
combined with the Keithley Model 2612A Dual-channel System SourceMeter Instrument,
which provides up to 200V per channel (400V differential across two channels)
or 10A pulse (1.5A continuous). For even higher power testing, ACS Basic Edition
can be combined with the Keithley Model 2430 1kW Pulse Mode System SourceMeter
Instrument for sourcing and measuring up to 100V at 10A with 150 micro-second
pulses. When characterizing sensitive components such as advanced silicon gates
or nanoscale devices, the Keithley Model 2636A Dual-channel System SourceMeter
Instrument is typically used. The Model 2636A provides two source-measure channels
with 1fA measurement resolution. A mix of SourceMeter Instruments can be combined
to provide a very wide range of capabilities within a single configuration.
ACS Basic Edition not only supports Keithley's line of System SourceMeter Instruments,
it also supports a wide range of switching solutions, popular LCR meters, and
component test fixtures. Combining ACS Basic Edition's multi-test capability
with Keithley Series 3700 or Model 707A switching mainframes allows a number
of tests to be performed on a more complex component such as a resistor network,
op-amp, or another higher pin-count device. Some components require both DC
I/V testing as well as capacitance or C-V measurements. ACS Basic Edition can
easily combine DC I/V tests with LCR measurements using multi-test and switching.
Smooth Migration between ACS and ACS Basic Edition Applications
Initial ACS systems today are found in package level and wafer level device
characterization test applications that include parametric die-sort, wafer level
reliability, parametric characterization, and component test. All ACS systems,
including the new Basic Edition, share key components that result in test project
portability and correlation across a wide range of systems. For instance, a
project developed in Basic Edition can be run on any ACS system that uses the
same hardware foundation. This means that small scale ACS Basic Edition test
systems that might incorporate a single SourceMeter Instrument can be used to
develop test projects for a multi-site die-sort system using 20 SourceMeter
Instruments.