Materials microscope users already benefiting from faster, easier-to-use and
intelligent microscope control and image evaluation with the recent launch of
Zeiss AxioVision 4.7 image analysis software can now profit from improved
surface roughness and height measurements with an enhanced Topography module.
For users of stereomicroscopes, new functions simplify and improve the microscopic
measurement of surface roughness and the heights of microstructures, resulting
in unsurpassed, detailed images. The roughness values from unfiltered primary
profiles, highpass-filtered roughness profiles and lowpass-filtered waviness
profiles can now be determined and an unlimited number of profile lines can
be drawn and compared in the image.
In addition to roughness measurements, height measurements have also been optimized.
For the first time users may specify the cut-off wavelength for Gaussian filtering
of the calculated height chart. A motorized focus system is no longer required
as height images of stereo image pairs of an object can now be calculated on
the stereomicroscope, using a dual phototube and two cameras.
Carl Zeiss’ suggested stereomicroscope system for comprehensive height
measurements is the SteREO Discovery.V8 with dual phototube S, two AxioCam ICc1
digital microscope cameras, the image analysis mini workstation, plus AxioVision
4.7 with the optional AxioVision ‘Topography module’. Other refinements
in AxioVision 4.7 include the new ‘Fast MosaiX’ module, which can
scan large surfaces up to ten times faster than current solutions, the measurement,
segmentation and further processing of 3D objects by the ‘3D measurement’
module and the ‘Comparative diagrams’ module, all of which serve
to help in the assessment of materials. Reporting is fast and easy with a diagram
view for data lists that enables simple preparation of bar and pie charts as
well as scatter plots and the ability to export reports into the Microsoft Word-compatible