Axio CSM 700 confocal microscope from Carl
Zeiss offers outstanding price/performance for materials scientists.
The Axio CSM 700 confocal microscope from Carl Zeiss meets users’ demands
for rapid and robust non-contact measurement of 3D microstructures and determination
of surface roughness. Ideal for materials research, quality inspection and routine
applications, the Axio CSM 700 displays surfaces three-dimensionally in high
resolution and in true colour even on relatively "soft" surfaces.
The high-quality ZEISS optics allow topographical measurements to be performed
at up to 117 frames per second. Step heights from approx. 20 nm up to the millimetre
range are detected at a depth of focus previously only possible with the scanning
electron microscope. These attributes will be useful in the examination of many
materials, including LCD panels, semiconductors, colour filters, glass, polymers
Despite the new microscope’s outstanding functionality, it is easy to
operate, with all the major functions and measurement parameters controlled
through the large, LCD control panel. This comprehensive control is complemented
by the intuitive control software, which provides many analysis options, including
the measurement of roughness, evaluation of layer thickness and particle analysis.