Europe and JEOL have announced an agreement that appoints Nikon as the official
European distributor of the innovative NeoScope benchtop SEM (scanning electron
Whether used by trained electron microscopists as a compact screening instrument,
or by lab technicians seeking a higher resolution alternative to the light microscope,
the NeoScope will help accelerate the pace of research in all fields. Offering
simplicity and affordability along with benchtop convenience, the NeoScope is
ideal for use in the areas of sampling inspection, failure analysis of manufacturing
materials, materials research, metallurgical laboratories, medical devices,
forensics, bioscience research, pathology and environmental laboratories
Welcoming the new agreement, Bill Clement, Industrial Sales Manager at Nikon
Instruments commented, "JEOL is a global leading company in scanning electron
microscopy and is innovating technology in this area. The NeoScope is a fresh
new approach offering a powerful yet affordable benchtop SEM. By offering the
NeoScope together with Nikon's microscopes and digital cameras, we are able
to offer a comprehensive range of imaging and inspection solutions from nano-
to micro- to macro-features."
Nikon pioneers microscopy technology, using its advanced technologies to develop
innovative video measuring systems such as the iNexiv VMA-2520 for the metrology
sector and unique interdisciplinary products such as the AZ100 and LV-UDM microscopes;
and the recently launched groundbreaking inverted and confocal ranges, the Eclipse
Ti inverted microscope and A1 confocal laser scanner systems.
With decades of experience in Europe-wide support and commitment to full customer
satisfaction, Nikon Instruments Europe will ensure that the customers of the
JEOL NeoScope are supported by its extensive service and technical support network,
offering full and extended warranty options.
An entirely new advanced imaging tool, the NeoScope makes it straight forward
to obtain images of high magnification, high resolution and large depth of field
using a microscope that is as simple to operate as a digital camera, with the
powerful electron optics of an SEM. A wide range of samples and materials can
be loaded and imaged quickly and conveniently.