Carl Zeiss introduces
the LSM 700 / mat laser scanning microscope for materials research. It allows
very precise, 3-dimensional imaging of surfaces. The combination of fluorescence
and reflection techniques enables high-precision examination of semiconductors,
metal, glass and polymers with high information content. The integrated detection
of fluorescence signals on and in the materials provides additional information.
Photo of 3D surface topography of a solar collector captured with the LSM 700 laser scanning microscope from Carl Zeiss, EC Epiplan- Apochromat objective 50x/0.95; original stack: 80.1 µm x 80.1 µm x 8.2 µm.
The easy-to-use system permits precise capture of 3D topography or the determination
of finest roughness, for example, without damaging the surface. The high reproducibility
of the measured values, even of relatively soft surfaces such as polymers, is
another outstanding feature of this microscope system.
Together with the Axio Scope, Axio Imager and Axio Observer microscopes from
Carl Zeiss, the LSM 700 is an ideal system for materials research. Combining
this system with the Axio Imager and Axio Observer, in particular, enables a
wide variety of configurations. Therefore, various contrasting techniques from
brightfield, darkfield and polarization-optical and standard DIC contrast to
polarization and fluorescence contrast become possible.