FEI’s
new Magellan™ extreme high-resolution scanning electron microscope (XHR
SEM) allows scientists and engineers to quickly see 3D surface images at many
different angles and at resolutions below one nanometer (about the size of ten
hydrogen atoms, side-by-side). Most importantly, the Magellan XHR SEM images
samples at very low beam energies, avoiding distortions otherwise caused by
the beam penetrating into the material below.
The Magellan Extreme High resolution SEM from FEI.
FEI delivers the most innovative solutions for imaging, characterization and
prototyping at the nanoscale. The company’s most advanced TEM, SEM, and
DualBeam™ solutions were created specifically for materials science, life
science, and mining. Please visit FEI at Pittcon 2009 in booth 1642 to learn
more about the Magellan and other high-resolution microscopy techniques.