Nanometrics Incorporated
(Nasdaq:NANO), a leading supplier of advanced process control metrology
equipment to customers in the semiconductor, silicon wafer, data storage, solar
photovoltaic and HB-LED industries, announced today that James P. Moniz has
been named Chief Financial Officer (CFO) of the company, effective February
18, 2009.
Prior to joining Nanometrics, Mr. Moniz, age 51, served as CFO of Photon Dynamics,
Inc. from April 2008 until its recent acquisition by Orbotech Ltd. For the eight
years prior, Mr. Moniz was CFO, Treasurer and Assistant Secretary of Nextest
Systems Corporation until its acquisition by Teradyne in 2008. From June 1998
until October 2000, he was Vice President and Chief Financial Officer of Millennia
Vision Corporation, and from October 1996 until May 1998 he served as Vice President
of Finance for Fairchild Imaging Systems. Previously, from November 1991 until
October 1996, Mr. Moniz served as Vice President of Finance and Administration
and later as President of Rolm Computers.
“We are excited to welcome Jim Moniz to the Nanometrics management team,”
commented Dr. Timothy J. Stultz, president and chief executive officer. “After
an exhaustive five-month search, we found a financial executive with the right
blend of professional, industry and business experience to make immediate and
long term contributions to Nanometrics. Jim brings over two decades of senior
financial leadership experience, including serving as CFO of two publicly-traded
companies in our sector. He has a superb knowledge of the semiconductor manufacturing
industry and will be a great addition to our management team. Finally, I’d
like to express my gratitude to Bruce Crawford, our COO, who has done a terrific
job over the past five months of shouldering the added responsibility of CFO
while we conducted our search.”
Nanometrics is a leader in the design, manufacture and marketing of high-performance
process control metrology systems used primarily in semiconductor manufacturing
and also by customers in the silicon wafer, data storage, solar photovoltaic
and HB-LED (high-brightness light-emitting diode) industries. Nanometrics standalone
and integrated metrology systems measure various thin film properties, critical
dimensions, overlay control and optical, electrical and material properties,
including the structural composition of silicon, compound semiconductor and
photovoltaic devices, during various steps of the manufacturing process. These
systems enable device manufacturers to improve yields, increase productivity
and lower their manufacturing costs. The company maintains its headquarters
in Milpitas, California, with sales and service offices worldwide.