JEOL, renowned for its
role in the development and manufacture of advanced electron microscopy and
spectroscopy products since 1949, kicks off its 60th anniversary celebration
at Pittcon (Chicago, March 8-13, 2009), the premier conference and exposition
on laboratory sciences.
Pittcon, also celebrating its 60th anniversary, is known for being the exhibition
where companies debut their latest products and technology. JEOL USA will introduce
new microscopy and spectrometry instrumentation, as well as spotlight the company’s
advances in NMR. Additionally, JEOL will present new topics on NMR and TEM during
the invited symposia, The State-of-the-Art Technologies from Japan I and II,
held during the Pittcon 2009 Symposium week on March 10th.
Instrumentation for Advancing Scientific Research
Scientists pushing the frontiers of discovery in nanotechnology and the life
sciences have been turning to JEOL since the first JEOL Transmission Electron
Microscope (TEM) was introduced in 1949. An entirely new generation of TEM enables
atom-by-atom analysis of manmade and biological materials, cryo-microscopy,
and 3D tomography. JEOL’s advances in sample preparation tools and ultrahigh
resolution Scanning Electron Microscope (SEM) imaging have helped industry to
develop more absorbent paper, tougher coating materials, and better interfaces.
JEOL photolithography tools are writing linewidths as small as 8 nanometers
for semiconductor applications. JEOL’s patented direct analysis in real
time (DARTTM) ion source has revolutionized mass spectrometry for homeland security
and forensics as well as synthetics and other chemical products.
Industry-leading Imaging Resolution
At Pittcon 2009, JEOL will introduce a new atomic resolution analytical microscope
that establishes a new benchmark. A new family of Scanning Electron Microscopes
includes a new thermal field emission SEM that combines high speed analysis
with ultrahigh resolution imaging at 1,000,000X magnification. The powerful
imaging capability of the SEM is now available in a benchtop model, an economical
bridge from the optical microscope to the high depth of field of the electron
More than 50 Years of Expertise in Analytical Spectrometry
JEOL introduced its first Nuclear Magnetic Resonance (NMR) spectrometer in
1956, and has contributed to the advancement of this highly specialized technology
with an industry-leading, cyber-enabled software platform, automatic sample
exchange, and flexibility for routine classroom operation to running the most
demanding multi-dimensional NMR experiments. The company has revolutionized
mass spectrometry with the introduction of a direct analysis technique that
bypasses traditional sample preparation and performs exact mass analysis with
Widest Ranges of Imaging and Analysis Products
JEOL offers the widest range of imaging and analysis products to choose from,
including TEM, SEM, surface analysis, e-beam lithography, wafer inspection systems,
high resolution mass spectrometers, and NMR for routine and advanced spectroscopy.
Renowned for service and support, JEOL USA has been awarded the Omega Award
for service for seven consecutive years.