The year 2009 marks the introduction of a new generation of Transmission Electron
Microscope (TEM) for JEOL,
as well as the 60th anniversary of the company with the longest history of innovation
and leadership in electron microscopy. JEOL is pleased to introduce the new
JEM-ARM200F atomic resolution analytical microscope.
Highest Resolution Commercially Available
According to JEOL USA, the company’s U.S. subsidiary, JEOL has unveiled
its new JEM-ARM200F atomic resolution analytical microscope, setting a new benchmark
for advanced, aberration-corrected S/TEM technology with the highest resolution
commercially available in its class. Through a rigorous development and design
program inspired by JEOL customers, the JEOL team has produced an entirely new
platform of TEM that achieves a guaranteed HAADF-STEM (high angle annular dark
field) resolution of 80 picometers, or 0.08 nanometers.
Enhanced Analytical S/TEM
With advanced analytical capabilities, the JEM-ARM200F enables both atom-by-atom
imaging resolution and unmatched spatial resolution for atom-to-atom chemical
mapping of materials, including EDS (energy-dispersive x-ray spectroscopy) and
EELS (electron energy-loss spectroscopy). The completely new electron column
design integrates S/TEM with Cs correction for atomic spatial energy resolution
combined with high probe currents for microanalysis.
Ultimate Stability at the Sub-Nanometer Scale
The JEM-ARM200F offers the ultimate stability for imaging and analysis at the
sub-nanometer scale. The electron column is isolated from the environmental
disturbances found in most labs. A superior shielding design safeguards the
ultrahigh-powered optics from airflow, vibration, and acoustical interference.
Additional shielding ensures protection from electronic interference, magnetic
fields, and thermal fluctuations.
Integrated Software Automation
The latest in software automation has been designed into the new ARM200F, with
tomography and holography simplified by a user-friendly GUI.
First U.S. Installation in World-renowned Researcher’s Lab
The University of Texas at San Antonio (UTSA) will be the site of the first
installation of the new JEM-ARM200F. The microscope will be housed in the Advanced
Microscopy Laboratory under the supervision of world-renowned researcher Miguel
Yacaman, chair of the College of Sciences’ Department of Physics and Astronomy.
There, it will support first-class research in nanotechnology, materials science,
medicine, biology, chemistry and engineering.
Backed by Award-winning Service and Support
JEOL USA is renowned for its unrivaled applications expertise and training,
plus its comprehensive, award-winning 24/7 service.