WITec, a manufacturer of high-resolution Optical and Scanning Probe Microscopy solutions, has introduced the WITec Project Plus software package for advanced data evaluation and chemometric image processing. It features various tools for multivariate data analysis in the fields of Confocal Raman Imaging and Scanning Probe Microscopy such as cluster analysis and principal component analysis.
Thus, hidden structures in the images can be visualized automatically, leading to quick and consistent interpretation of the data. Additionally, a variety of advanced patent-pending analysis tools and algorithms enable comprehensive and userfriendly computerized data evaluation and image generation.
The speed with which the extensive calculations behind the various algorithms and procedures can be executed is unprecedented and provides a new level of capability in analysis operations. WITec Project Plus can be obtained as an add-on software package for the WITec Project data evaluation software.
For more information please go to http://www.lot-oriel.com/site/site_down/witec_projectplus_uk01.pdf or call Shayz Ikram on 01372 378822, e-mail [email protected]