A new e-brochure from JEOL
illustrates the application of an ion beam cross section polisher for SEM sample
preparation of solar panel thin films and kerogen-rich shale samples. The online
brochure includes SEM images as well as movie and 3D files of complex shale
composites and EBSD orientation maps of solar panel thin films. The JEOL cross
section polisher produces cross sections without smearing, crumbling, or distortion
- ideal for preparing difficult samples.
JEOL is a world leader in electron optical equipment and instrumentation for
high-end scientific and industrial research and development. Core product groups
include electron microscopes (SEMs and TEMs), instruments for the semiconductor
industry (electron beam lithography and a series of defect review and inspection
tools), and analytical instruments including mass spectrometers, NMRs and ESRs.
JEOL USA, Inc., is a wholly owned subsidiary of JEOL, Ltd., Japan, was incorporated
in the United States in 1962. The company has 13 regional service centers that
offer unlimited emergency service and support in the U.S.
For more information about JEOL USA, Inc. or any JEOL products, visit www.jeolusa.com,
or call 978-535-5900.