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Posted in | Nanoelectronics

Webinar Targetting Engineers New to Semiconductor Materials and Device Testing

Published on May 22, 2009 at 8:50 AM

Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems, will broadcast a free, web-based seminar titled "Semiconductor Capacitance-Voltage (C-V) Fundamentals," which will be presented by Electronic Design magazine.

Lee Stauffer, Senior Staff Technologist for Keithley’s Semiconductor Measurements Group will present the webinar and take questions from the audience at the end. The webinar will be broadcast on Tuesday, June 2, at 2:00 p.m. ET (11:00 a.m. PT). This one-hour seminar is designed to introduce the topic of C-V measurements as they relate to semiconductor device and materials characterization. Click here to register for this event.

C-V testing is commonly used to determine semiconductor parameters such as doping profiles, density of interface states, threshold voltages, oxide charge, and carrier lifetime. The Keithley webinar is targeted to engineers who are new to semiconductor materials and device testing, process and device engineers who would like to refresh their knowledge of this testing methodology, and characterization lab managers. Those attending the seminar will learn what C-V testing is, the types of devices C-V testing can be used to characterize, who can use it, and the challenges associated with making C-V measurements.

Lee Stauffer is Senior Staff Technologist for Keithley Instruments’ Semiconductor Measurements Group, based in Cleveland, Ohio. Prior to joining Keithley, his career included designing satellite communication systems, as well as equipment and product engineering in semiconductor fabs.

Registration Information.

“Semiconductor Capacitance-Voltage (C-V) Fundamentals” will be broadcast on Tuesday, June 2, at 2:00 p.m. ET (11:00 a.m. PT). The event is free to the public, but participants must register at in advance. The seminar will also be archived on Keithley’s website for those unable to attend the original broadcast.

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