JPK
Instruments, a world-leading manufacturer of nanoanalytic instrumentation
for research in life sciences and soft matter, is pleased to announce a new
accessory for its NanoWizard® product line.
JPK's new Conductive AFM module for the NanoWizard AFM family
The new conductive AFM module for JPK's NanoWizard® II AFM maps local conductivity
changes. Operating in contact, intermittent contact and spectroscopy modes,
applications include charge mapping in polymers, organic semiconductors, nanotubes
and nanoparticles.
Conductive AFM (CAFM), records the current flowing between an electrically
conductive cantilever (typically Pt/Ir or Cr/Pt) and substrate while a bias
is applied between tip and sample. JPK's new conductive AFM accessory attaches
directly to the base of the NanoWizard head. An ultra-sensitive pre-amplifier
enables detection of sub picoamp currents. Bias voltage is software selected
with range +/- 10 Volts. Conductivity mapping can be carried out in both contact
and intermittent contact modes, under ambient or oxygen-free conditions, whilst
simultaneously displaying the surface topography image. Powerful spectroscopy
software allows the variation in current to be tracked as the potential is ramped
at user defined locations. This is referred to as current voltage (I/V) spectroscopy.
The sample holder supplied with the NanoWizard® II CAFM module supports
metal stubs, glass slides and cover slips. A separate holder is used for optically
transparent samples enabling simultaneous measurement of fluorescence. A spring
loaded electrode guides the bias voltage to the sample surface. Alternatively,
conductive lacquer can be used. Samples can also be prepared on HOPG and other
electrically conductive flat samples such as indium tin oxide (ITO). Applications
include metals, semiconductors, polymers, ferroelectrics, dielectrics and organic
conductors.