FRT, a trusted partner
for industry-proven metrological surface measuring systems, presents a new optical
film thickness measuring tool at this year's Laser 2009 in Munich. The new MicroSpy
FT non-destructively measures coatings that transparent or semi-transparent
in the visible and near-infrared spectrum of light.
The easy to use film thickness measuring tool is cost-effective and powerful
at the same time. With its innovative 3D film thickness mapping mode, the tool
allows the thickness measurement of entire coating areas to visualize and evaluate
the evenness of film thickness distribution as well as classical point and profile
measurements on the coating. Furthermore, self-supported films such as foils,
single films or stacked films on a substrate can be characterized. The tool
is used in research and quality control of innovative products in the fields
of medical-, semiconductor- and microsystem technology (MST) as well as in photovoltaics,
optics and the automotive industry.
According to the given measurement task, the new FRT MicroSpy FT is equipped
with a fast interferometric or reflectometric film thickness sensor. A selection
of nine different sensor types with various light sources, measuring spot sizes
and thickness measuring ranges offer great flexibility for the measurement of
all kinds of coating materials and coating thicknesses from a few millimeters
down to 10 nanometers.
The new tool is very easy to use with minimum training required. Its integrated
CCD-camera with illumination provides a live camera picture of the measuring
area directly in the software. Sample positioning is done with the click of
a mouse button through a motorized precision table with a travel range of 50
mm x 50 mm. To put the sensor in perfect focus, FRT has included a high-precision
z-axis with micrometer resolution that is usually found in only the very highest
quality optical microscopes.