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Agar Scientific Announces Availability of Model 1040 NanoMill TEM Specimen Preparation System

Published on August 11, 2009 at 10:09 AM

Agar Scientific, Fischione Instruments exclusive distributor of instrumentation in the UK + Ireland are pleased to announce the availability of the Model 1040 NanoMill® TEM specimen preparation system.

Fischione Instruments' Model 1040 NanoMill® TEM specimen preparation system

Using a revolutionary ultra-low-energy, concentrated ion beam, Fischione's Model 1040 NanoMill® TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy (TEM) imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally-prepared specimens.

Applying the targeted, ultra-low-energy NanoMillingsm process, the NanoMill® system features gaseous ion source technology that results in ion energies as low as 50eV and a beam size as small as 2 microns. It allows specimens to be prepared without amorphization, implantation, or re-deposition. The ion beam can be targeted to a specific area of interest. A secondary electron detector (SED) is used to image the ion-induced secondary electrons that are generated from the targeted area of the specimen.

Its automated operation makes the NanoMill® system easily programmable. Adjustable ion beam energies, milling angles, specimen rotation, and cryogenic specimen cooling parameters afford maximum flexibility to ensure the optimal preparation of a wide variety of specimens. A vacuum load lock facilitates rapid specimen exchange for high-throughput applications.

A sixteen page brochure is available for downloading here. This provides full details of the new system illustrating its use with many high resolution applications from users around the world.

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