Fischione Instruments exclusive distributor of instrumentation in the UK +
Ireland are pleased to announce the availability of the Model 1040 NanoMill®
TEM specimen preparation system.
Fischione Instruments' Model 1040 NanoMill® TEM specimen preparation system
Using a revolutionary ultra-low-energy, concentrated ion beam, Fischione's
Model 1040 NanoMill® TEM specimen preparation system is an excellent tool
for creating the high-quality thin specimens needed for advanced transmission
electron microscopy (TEM) imaging and analysis. It is ideal for both post-FIB
(focused ion beam) processing and the enhancement of conventionally-prepared
Applying the targeted, ultra-low-energy NanoMillingsm process, the NanoMill®
system features gaseous ion source technology that results in ion energies as
low as 50eV and a beam size as small as 2 microns. It allows specimens to be
prepared without amorphization, implantation, or re-deposition. The ion beam
can be targeted to a specific area of interest. A secondary electron detector
(SED) is used to image the ion-induced secondary electrons that are generated
from the targeted area of the specimen.
Its automated operation makes the NanoMill® system easily programmable.
Adjustable ion beam energies, milling angles, specimen rotation, and cryogenic
specimen cooling parameters afford maximum flexibility to ensure the optimal
preparation of a wide variety of specimens. A vacuum load lock facilitates rapid
specimen exchange for high-throughput applications.
A sixteen page brochure is available for downloading here.
This provides full details of the new system illustrating its use with many
high resolution applications from users around the world.