JEOL, a leading supplier
of high resolution, high performance Scanning Electron Microscopes (SEM) and
atomic resolution Transmission Electron Microscopes (TEM), has developed two
new publications that explain theory and operation of the SEM for routine imaging
and elemental analysis.
These two new books can be downloaded from the JEOL USA website (jeolusa.com)
under the Resources tab, or by clicking on http://tiny.cc/SEMAZ
They are a useful resource for novice users of SEM or anyone teaching basic
"SEM: Scanning Electron Microscope A to Z - Basic Knowledge for Using
the SEM," explains basic principals of operation, image display, the role
of secondary and backscattered electron detectors, and the vacuum system. Further
explanation of the SEM includes edge effect, the influence of accelerating voltage,
the illumination effect of secondary and backscatter electron detectors, techniques
for improving image resolution, benefits of different types of electron guns,
elemental analysis, and sample preparation.
"SEM Q&A," answers specific questions most often asked during
demonstrations and training: how to mount powder samples, selecting the accelerating
voltage, stereoscopic observation techniques, and more.
These documents replace two popular, long-standing JEOL books, "A Guide
to Scanning" and "Introduction to the SEM World."