Site Sponsors
  • Oxford Instruments Nanoanalysis - X-Max Large Area Analytical EDS SDD
  • Park Systems - Manufacturer of a complete range of AFM solutions
  • Strem Chemicals - Nanomaterials for R&D
Posted in | Nanoanalysis
Save 20% On a Jenway 7315 Spectrophotometer from Bibby Scientific

There is 1 related live offer.

20% Off Jenway Spectrophotometer

Advanced Techniques for Materials Characterization

Published on September 7, 2009 at 9:48 AM

Research and Markets , the leading source for international market research and market data, has announced the addition of the "Advanced Techniques for Materials Characterization" report to their offering.

Nowadays, an impressively large number of powerful characterization techniques is being used by physicists, chemists, biologists and engineers in order to solve analytical research problems; especially those related to the investigation of the properties of new materials for advanced applications. Although there are a few available books which deal with such experimental techniques, they are either too exhaustive and cover very few techniques or are too elementary to provide a solid basis for learning to use the characterization technique. Moreover, such books usually over-emphasize the textbook approach: being full of theoretical concepts and mathematical derivations, and omitting the practical instruction required in order to permit newcomers to use the techniques.

A major objective of the present work is therefore to provide key information that is sufficient to permit the reader to carry out independent research using these characterization techniques. The concise text not only includes classical Diffraction, Spectroscopic and Microscopical techniques but also advanced state-of-the-art techniques such as positron annihilation spectroscopy (PAS), small-angle neutron scattering (SANS), small-angle X-ray scattering (SAXS) and others. The work consists of some 20 chapters; each dedicated to a particular technique, and in the form of a compilation of lectures delivered by dedicated researchers having extensive experience in using the particular technique. Each well-structured chapter consists of a brief introduction to the working principles, ample background references and a summary of the potential of the technique; plus its limitations. A separate section is devoted to instrumentation; with explicit schematics for each component. Other sections describe the pitfalls which can accompany physical measurements, such as those related to sensitivity limits, precision and accuracy; and also the practical difficulties faced by beginners (possible avenues of error incorporation, choice of detector, slits, calibration, mode of standardization etc.) plus useful tips for overcoming these difficulties. Examples are taken from cutting-edge research areas and are discussed at length in order to show how a particular technique can be used to solve such advanced problems.

This book will therefore provide the aspiring post-graduate/research student with the flavor of a large number of characterization techniques, and researchers who routinely use these techniques will now have a comprehensive and handy reference guide to important working formulae and practical tips.. Finally, already-expert technicians will be updated concerning the latest applications of the techniques This is altogether an unique and invaluable publication.

Tell Us What You Think

Do you have a review, update or anything you would like to add to this news story?

Leave your feedback
Submit