Cypher AFM from Asylum Research Wins Prestigious Product Innovation Award

Asylum Research has announced that their Cypher Atomic Force Microscope (AFM) has been awarded the prestigious Frost and Sullivan North America Best Practices Product Innovation Award for 2009. Cypher is the first completely new small sample AFM/SPM in over a decade and is the world's highest resolution AFM. The Cypher AFM achieves closed loop atomic resolution using sensors in all three axes, combining the accuracy and control of closed loop with atomic resolution for the most accurate images and measurements possible today.

In addition to its superior capabilities for imaging and measurement, Cypher breaks down ease-of-use barriers with its exclusive point-and-click SpotOnTM automated laser and photodetector alignment. Additional unique capabilities include interchangeable light source modules that allow laser spot sizes down to 3um for broad application and scan mode flexibility, and support for high-speed AC imaging (>10x faster) with cantilevers smaller than 10um. The system also includes an integrated enclosure which provides acoustic and vibration isolation, as well as excellent thermal control for image and measurement stability.

Frost & Sullivan Best Practices Awards recognize companies in a variety of regional and global markets for demonstrating outstanding achievement and superior performance. Industry analysts compare market participants and measure performance through in-depth interviews, analysis, and extensive secondary research in order to identify best practices in industry.

"Market reaction to the Cypher AFM has been phenomenal and, along with the continued success of our MFP-3D AFM family, has resulted in record sales results for Asylum Research. Following on Cypher's R&D100 and Lab Equipment Awards, the Frost & Sullivan Award further validates our belief that the Cypher system outclasses and outperforms anything else on the market," stated Dr. Roger Proksch, President of Asylum Research.

The Asylum Cypher High Resolution AFM (Atomic Force Microscope) - Key Features

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