Abstracts for contributed talks and posters are now being accepted for the International Workshop for Scanning Probe Microscopy (SPM) for Energy Applications. Co-organized by Oak Ridge National Laboratory (ORNL) and Asylum Research, the workshop will held at ORNL September 15-17, 2010.
Deadline for abstract submission is August 13. The program will include invited and contributed talks covering recent advances in characterization of energy-relevant materials systems using SPM/AFM techniques, as well as the state of the art in energy dissipation and transformation measurements by SPM/AFM. The three-day meeting will also include a poster session, as well as an equipment lab and hands-on tutorials for demonstration of recently developed dynamic and multi-spectral SPM/AFM modes on Asylum's Cypher™ and MFP-3D™ SPM/AFMs. The keynote talk will be on "Local Probing of Carrier Dynamics in Polymer Photovoltaic Materials" by David Ginger of the University of Washington.
Abstracts can be submitted on the following topics (but are not limited to):
- Mapping of carrier dynamics and photoinduced behavior of photovoltaic materials
- Micro Raman and NSOM imaging of energy-related materials
- Local ionic and electronic transport in fuel cells and Li-ion batteries
- Energy harvesting by nanostructured piezoelectric and ferroelectric systems
- Novel advances in functional probes – microwave, thermal, and conductive
- Imaging energy dissipation by multimodal and Band Excitation SPM/AFM
- Bias-induced phase transitions
Asylum Research is the technology leader in atomic force and scanning probe microscopy (AFM/SPM) for both materials and bioscience applications. Founded in 1999, we are an employee owned company dedicated to innovative instrumentation for nanoscience and nanotechnology, with over 250 years combined AFM/SPM experience among our staff. Our instruments are used for a variety of nanoscience applications in material science, physics, polymers, chemistry, biomaterials, and bioscience, including single molecule mechanical experiments on DNA, protein unfolding and polymer elasticity, as well as force measurements for biomaterials, chemical sensing, polymers, colloidal forces, adhesion, and more. Asylum's product line offers imaging and measurement capabilities for a wide range of samples, including advanced techniques such as electrical characterization (CAFM, KFM, EFM), high voltage piezoresponse force microscopy (PFM), thermal analysis, quantitative nanoindenting, and a wide range of environmental accessories and application-ready modules.
Asylum's MFP-3D set the standard for AFM technology, with unprecedented precision and flexibility. The MFP-3D is the first AFM with true independent piezo positioning in all three axes, combined with low noise closed-loop feedback sensor technology. The MFP-3D offers both top and bottom sample viewing and easy integration with most commercially-available inverted optical microscopes.
Asylum's new Cypher AFM is the world's first new small sample AFM/SPM in over a decade, and sets the new standard as the world's highest resolution AFM. Cypher provides low-drift closed loop atomic resolution for the most accurate images and measurements possible today, rapid AC imaging with small cantilevers, Spot-On™ automated laser alignment for easy setup, integrated thermal, acoustic and vibration control, and broad support for all major AFM/SPM scanning modes and capabilities.
Asylum Research offers the lowest cost of ownership of any AFM company. Ask us about our industry-best 2-year warranty, our legendary product and applications support, and our exclusive 6-month money-back satisfaction guarantee. We are dedicated to providing the most technically advanced AFMs for researchers who want to take their experiments to the next level. Asylum Research also distributes third party cantilevers from Olympus, Nanoworld/Nanosensors, and our own MFM and iDrive™ tips.