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FEI and Nanoinics to Develop Hybrid AFM-SEM

Published on September 28, 2010 at 8:10 PM

FEI Company (NASDAQ: FEIC), a leading instrumentation company providing electron microscope systems for applications across many industries, announces that it has entered into an agreement to collaborate with Nanonics Imaging Ltd., based in Israel, to explore the feasibility of adding an atomic force microscope (AFM) to an FEI DualBeam focused ion beam (FIB)/scanning electron microscope (SEM) system.

The AFM is used for imaging, measuring and manipulating matter at the nanoscale. It uses a mechanical probe to measure the surface topography of a sample. The DualBeam is a FIB/SEM system that provides three dimensional (3D) imaging and analysis down to the nanoscale. The DualBeam uses an SEM to image FIB-milled cross sections, which reveal subsurface features.

About Nanonics
Nanonics Imaging Ltd. is the market leader of combined near-field optical microscopes (commonly referred to as either NSOM or SNOM systems) and atomic force microscopes (AFM). Incorporated in 1997, Nanonics is the longest established and most experienced supplier of such systems in the market, whose products have won several awards. These awards have recognized innovations and pioneering developments in multiprobe atomic force microscopy and transparently integrated AFM Raman microspectroscopy. Nanonics platforms with their associated probe technologies have circumvented barriers that have prevented AFM from effective integration into electron optical and similar upright microscope geometries. More information can be found at: www.nanonics.co.il

About FEI
FEI (Nasdaq: FEIC) is a leading diversified scientific instruments company. It is a premier provider of electron- and ion-beam microscopes and tools for nanoscale applications across many industries: industrial and academic materials research, life sciences, semiconductors, data storage, natural resources and more. With more than 60 years of technological innovation and leadership, FEI has set the performance standard in transmission electron microscopes (TEM), scanning electron microscopes (SEM) and DualBeams, which combine a SEM with a focused ion beam (FIB). FEI's imaging systems provide 3D characterization, analysis and modification/prototyping with resolutions down to the sub-Ångström (one-tenth of a nanometer) level. FEI's NanoPorts in North America, Europe and Asia provide centers of technical excellence where its world-class community of customers and specialists collaborate. FEI has approximately 1800 employees and sales and service operations in more than 50 countries around the world. More information can be found at: www.fei.com.

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