(NASDAQ: FEIC), a leading instrumentation company providing electron microscope
systems for applications across many industries, announces the availability
of "An Introduction to Electron Microscopy," an all-new edition of
its well-known primer about electron and ion beam microscopy. The booklet can
be downloaded for free at www.fei.com.
The 40-page booklet is ideal for a student or business professional who would
like a view into the world of nanotechnology. It contains a general overview
of electron and ion beam microscopes, including the history, technology, terminology
and applications of transmission electron, scanning electron, scanning transmission
electron, focused ion beam and DualBeam™ systems. Image examples cover
a variety of samples, such as pollen, semiconductors, steel, minerals, blood
cells, viruses, and more.
FEI (Nasdaq: FEIC) is a leading diversified scientific instruments company.
It is a premier provider of electron- and ion-beam microscopes and tools for
nanoscale applications across many industries: industrial and academic materials
research, life sciences, semiconductors, data storage, natural resources and
more. With more than 60 years of technological innovation and leadership, FEI
has set the performance standard in transmission electron microscopes (TEM),
scanning electron microscopes (SEM) and DualBeams™, which combine a SEM
with a focused ion beam (FIB). FEI’s imaging systems provide 3D characterization,
analysis and modification/prototyping with resolutions down to the sub-Ångström
(one-tenth of a nanometer) level. FEI’s NanoPorts in North America, Europe
and Asia provide centers of technical excellence where its world-class community
of customers and specialists collaborate. FEI has approximately 1800 employees
and sales and service operations in more than 50 countries around the world.