Technologies, the leading manufacturer of UV-visible-NIR microscopes and
microspectrometers, is pleased to announce the 308 FPD™: a spectrophotometer
designed to analyze the color and relative intensity of individual pixels of
The system attaches to a probe station or microscope to enable you to obtain
color data and relative intensity comparisons for flat panel displays of all
types. Also able to measure spectra on the micron scale, the 308 FPD™
can map the variations due to mura, perform pixel-to-pixel comparisons and can
even map spectral variations within a single pixel. With addition of CRAIC Technologies
QDI FilmPro™ software, the 308 FPD™ can also measure thin film thickness
and even cell gap thickness. This provides the display makers with an unparalleled
capability to optimize and improve their flat panel display manufacturing process
with a multi-faceted test solution: the 308 FPD™ spectrophotometer.
308 FPD Microscope Spectrophotometer
"Many of our customers want to measure ever smaller features on flat panel
displays. With our experience of spectroscopy and imaging on the micron scale,
developing the 308 FPD™ was a logical step for CRAIC Technologies"
says Dr. Paul Martin, President. "The 308 FPD™ features our proprietary
Lightblades™ spectrophotometers technology for improved performance and
enhanced flexibility. This system allows for colorimetry, spectroscopy and intensity
measurements on the micron scales that are common to advanced high resolution
displays. The 308 FPD™ can also be configured to measure thin film thickness
as well as for imaging. This allows for testing of many aspects of displays
with a single instrument."
The 308 FPD™ solution combines advanced Lightblades™ spectrophotometers
with sophisticated optics and software to enable the user to measure spectra,
colorimetry, light intensity and film thickness on the micron scale. As the
smallest pixels are now on the order of 10 microns across, the 308 FPD™
provides the ability to not only measure the color and intensity of the entire
display but also to compare pixels to pixels and even map out the changes within
a single pixel. Designed for the production environment, it can incorporate
automated measurement capabilities, touch screen controls, easily modified processing
recipes and sophisticated data analysis tools.