a leading supplier of microscopy accessories and consumables, announces the
new 1060 SEM Mill from Fischione Instruments to provide tabletop precision preparation
for producing high-quality SEM samples for a wide variety of applications.
Agar Scientific is a market leader in the supply of high quality accessories
to assist with sample preparation for electron microscopy. As applications become
more challenging, the sample preparation process has to be rapid, accurate and
reproducible. The New Model 1060 SEM Mill from Fischione is an excellent tool
for creating the sample surface characteristics needed for SEM imaging and analysis.
It incorporates two independently adjustable TrueFocus (patent pending) ion
sources, automatic gas control and an oil-free vacuum system for ultra-clean
The unit accommodates a wide range of sample sizes and configurations for applications
such as bulk milling, electron backscatter diffraction (EBSD) and semiconductor
preparation, together with traditional slope cutting and cross sectional polishing.
The Model 1060 has a vacuum load lock for extremely rapid sample exchange. Once
the sample is placed onto the stage, evacuation of the load lock occurs within
a few seconds. Before milling, an automatic height sensing system provides feedback
to a mechanical elevator so that the sample's top surface is properly aligned
with respect to the ion beams. Tilt angles are continuously adjustable in the
range from 0° to 10°. In addition to full sample rotation, the programmable
rocking angle control is ideally suited for preparing cross-section samples.
Ion milling is used in the physical sciences to enhance the quality of the
sample surface. Inert gas, typically argon, is ionised and then accelerated
toward the sample. Two TrueFocus ion sources direct controlled-diameter ion
beams to the sample regardless of energy. The unique design of the TrueFocus
ion source allows adjustable beam diameters. When operated in the upper energy
range (up to 6.0keV), milling is rapid, even at low angles. When operated at
low energy (as low as 100eV), material is gradually sputtered from the sample
without inducing artefacts.
The Model 1060 is modular in design allowing for basic instrument operation
or fully automated control. The basic version is for users who require only
primary level instrumentation function. The premium version adds full computer
control for setting, operating, and recording a broad variety of instrument
parameters. Ion milling is automatically terminated at the end of the programmed
A stereo microscope is available for the Model 1060 SEM Mill to enhance sample
viewing. The microscope's long working distance allows the sample to be observed
in situ while milling. The Model 1060 can also be configured with an imaging
system including a high magnification microscope coupled to a CCD camera and
video monitor to capture and display images.
The specifications of the Fischione Model 1060 SEM Mill are available to download
from their website. For further details of Fischione’s sample preparation
products and Agar’s complete range of accessories and consumables for
microscopy, please ask for a copy of the latest catalogue and price list. To
receive your free copy, please visit the Agar Website and register today.