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Test + Measurement World Honors Cascade Microtech's New Products in Wafer Probing Category

Published on February 18, 2011 at 5:17 AM

Cascade Microtech, Inc. (NASDAQ: CSCD) today announced that its VueTrack™ probe-to-pad alignment solution and its S-Technology™ Pyramid production test probe cards have been selected by the editors of Test & Measurement World as finalists for "Best in Test" products in the category of Wafer Probing.

The "Best in Test" awards are presented annually by Test & Measurement World to honor important and innovative new products and services in the electronics test and measurement industry.

VueTrack for unattended over-temperature test enables automatic probe-to-pad alignment by using a downward-looking microscope for measuring the probe tips and the wafer locations with the chuck in the same position in which the electrical measurement will be made. By enabling unattended testing over multiple temperatures ranging from -50 to 300°C, VueTrack eliminates the need for operator intervention and provides increased data throughput and high electrical test accuracy.

S-Technology Pyramid probe cards improve contact consistency at wafer probe, enabling at-speed multi-site known-good-die testing and reducing the overall cost-of-ownership. By standardizing force distribution, the cards minimize site-to-site test variation and increase overall test yield. The 20 g per tip keeps contact resistance to a minimum for up to 2000 probe tips. S-Technology can be used with all types of solder technologies, including Sn-capped Cu pillars with up to 400 micrometer pitch.

Cascade Microtech's BlueRay™ Semi-automatic Probe System Nominated for Test of Time Award

The BlueRay semi-automatic probe system is a finalist for the annual "Test of Time" award which honors a test, measurement, or inspection product that has provided state-of-the-art service for at least five years after its introduction. The BlueRay probe system was introduced in 2005 to meet the high-speed accuracy requirements for wafer-level functional testing of discrete devices such as LEDs, photodiodes, SAW/BAW, and MEMS devices. The system offers an upgrade path from engineering development in the lab to the production test floor, beginning with a benchtop device that can be upgraded step-by-step to a cassette-fed probe system for 24/7 operation. MultiDie™ testing technology enables the BlueRay to significantly increase test throughput by testing multiple die in parallel, which can result in a two-thirds reduction in wafer test costs.

"Cascade Microtech has a legacy of innovation dating back over 25 years," said Michael Burger, president and CEO of Cascade Microtech, Inc. "We are pleased to be among those recognized for product innovation in the wafer probing category, and to be recognized for our commitment to delivering leading-edge, practical solutions that solve our customers' toughest test and measurement challenges."

Source: http://www.cmicro.com/

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