Nanometrics, a provider of sophisticated metrology systems, has proclaimed that its Atlas XP+ optical critical dimension (OCD) metrology systems have been chosen by an Asian foundry for process control of sophisticated logic devices.
The Asian foundry selected the Atlas XP+ platform over competitive systems based on an extensive technical performance assessment on sophisticated devices. Nanometrics’ customer service capabilities and worldwide applications were also the factors behind the selection of the systems by the foundry.
This selection is considered as a long-term growing business for Nanometrics, as its systems are to be installed at various fabs globally in order to fabricate integrated circuits with design aspects at the 2x and 3x technology nodes.
The President and Chief Executive Officer at Nanometrics, Dr. Timothy J. Stultz stated that this selection represents the dominance of the company’s products in the development and production of the most challenging and sophisticated semiconductor devices. The company is dedicated to offer its advanced technology with customer support and global applications to assist its customers tackle their technology and business challenges, he added.
The Vice President of Semiconductor Business Unit at Nanometrics, David Doyle stated that unique materials such as high-K metal gates and 3D structures in combination with novel device structures defy the process control limits as logic manufacturers lead towards smaller technology nodes. The company’s OCD technology is a proven system to tackle this challenge and is a key factor for lowering production costs and increasing device output, he added.