Agilent Technologies Inc. (NYSE: A) today announced a new method for evaluating the slow deformation of materials under small stresses (a phenomenon known as "creep") via the use of instrumented indentation.
Available exclusively on the Agilent Nano Indenter G200 platform, the new technique is simpler, faster and easier than uniaxial creep testing. It can be used to map the spatial distribution of creep capacity in complex materials and is insensitive to thermal drift.
The Agilent G200 Nano Indenter.
"This innovative nanoindentation method further extends the already impressive utility of our Nano Indenter G200 platform," said Jeff Jones, general manager for Agilent's nano measurement facility in Chandler, Ariz. "The unique new capability will immediately improve testing protocols and increase the use and speed of measurement for our customers in materials research and development."
The experimentally robust test method allows researchers to measure strain-rate sensitivity, the most important quantification of creep. It overcomes problems associated with long testing times by imposing small strain rates only when the applied force is large. Values acquired on standard references with the new technique are in agreement with values obtained by others on similar materials utilizing both instrumented indentation and uniaxial creep testing. The easy-to-use method is implemented in the Agilent NanoSuite software package for the G200.
The world's most accurate, flexible and user-friendly instrument for nanoscale mechanical testing, the G200 utilizes electromagnetic actuation to achieve unparalleled dynamic range in force and displacement. The G200 enables measurement of Young's modulus and hardness in compliance with ISO 14577, as well as measurement of deformation over six orders of magnitude - from nanometers to millimeters.
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