Site Sponsors
  • Oxford Instruments Nanoanalysis - X-Max Large Area Analytical EDS SDD
  • 20% off Mass Spectrometer range at Conquer Scientific
  • Strem Chemicals - Nanomaterials for R&D
  • Park Systems - Manufacturer of a complete range of AFM solutions
  • Technical Sales Solutions - 5% off any SEM, TEM, FIB or Dual Beam
Posted in | Microscopy | Nanoanalysis
20% off Mass Spectrometer range at Conquer Scientific
Related Offers

New Characterization Tools to be Launched at 2013 Microscopy & Microanalysis Annual Meeting

Published on July 17, 2013 at 7:05 AM

Nanounity announces the public launch of new characterization tools and techniques for the microscopy community. Products from Pemtron & Delmic will debut at the annual 2013 Microscopy & Microanalysis Conference & Exhibition to be held in Indianapolis, August 4-8. The company will be presenting exciting new products of manufacturers from the USA, Korea and Europe.

The Pemtron SMART PS-250 SEM system

New instrumentation, tools and techniques, will be featured on the Nanounity booth, #828, at this year's annual M&M meeting being held in Indianapolis, August 4-8, 2013.

The Pemtron SEMART™ PS-250 scanning electron microscope (SEM) will be making its Nanounity US debut. This intermediate microscope provides users with quick and easy operation offering high performance at a reasonable price, a level that a user might expect to pay at least twice to own. With the power of the PS-230, the PS250 allows users to work with larger samples up to 140 mm while retaining 3 nm spatial resolution. Users may add optional EBSD (Electron Detector Back Scattered) and EDS (Energy Dispersive Spectrometer) for more comprehensive analytical performance.

Nanounity will unveil the Delmic SECOM platform for correlative microscopy. This combines functional information from fluorescence microscopy with structural information from the SEM. The SECOM platform integrates a fluorescence microscope with a scanning electron microscope. This combination makes it possible to do fast correlative microscopy with high overlay precision. The system is easy to use for both optical and electron microscopists and makes correlation fully automated. Delmic will give a tutorial on SECOM at 5.45pm on Tuesday 6th August at the Nanounity booth.

Nanounity specializes in the supply of complementary in situ techniques for the electron microscopist. Among the other techniques to be shown at this year's M&M will be optical profilers and nanomechanical testing systems that incorporate nano-hardness testing with surface topography.

The 2013 M&M event will open its doors on August 4th for five days of papers, posters and exhibitions at the Indianapolis Convention Center. For information and registration information, visit http://www.swiftpage6.com/www.microscopy.org/MandM/2013.

About Nanounity

NNanounity supplies surface science analytical solutions through a range of synergistic products through partnerships with leading instrumentation manufacturers. Our core technologies are microscopy, metrology and spectroscopy. Through the strong personal commitment of the founders, Nanounity has built a strong reputation in the USA and Asia providing high standards of materials knowledge enabling the Company to match the requirements of users to a range of tools and techniques. Backed with applications knowledge and customer service support, Nanounity offers experience and skills to help deliver innovative products of the highest performance at affordable prices.

Our product profile delivers solutions to researchers, engineers and scientists in many disciplines: from data storage, semiconductors, polymers, material science and the life sciences. These tools include compact SEMs, in-situ Raman spectroscopy and indentation for SEMs, correlative microscopy combining fluorescence imaging with SEM, optical profilers and nanomechanical testing systems that incorporate nano-hardness testing with surface topography. For details on Nanounity and all its products & solutions, visit http://www.nanounity.com/.

Tell Us What You Think

Do you have a review, update or anything you would like to add to this news story?

Leave your feedback
Submit