E M Optomechanical, Inc., has introduced a new version of its 3D MEMS Optical Profiler that has been specifically configured to meet the needs of educational institutions. Known as the OPTOPro Model 622-EDU, the Profiler is based on a patented technology, called long-working distance interference microscopy. The Model 622-EDU is intended primarily for use by educators for training students to make real-time dynamic measurements of the micro- and nano-scale motions of micro-electro-mechanical systems (MEMS) devices and other microsystems.
The Model 622-EDU was developed because there were no commercial optical profilers priced in a range suitable for educators to use as a teaching tool. "The Model 622-EDU is a valuable research tool as well and can be upgraded to the level of our flagship Model 622-A," says Tom Swann, president of EMOM.
The profiler instrument is controlled by EMOM's MEMScript Software that also acquires and analyzes the data collected. This software has several unique features, such as the ability to control microsystem devices, which by nature have moving parts, and making real time measurements of performance. "Scripts," which control the OPTOPro, together with additional teaching materials and a micro-device to be used as a test sample are included with the Model 622-EDU.
The Central New Mexico Community College (CNM) Southwest Center for Microsystems Education, has acquired the first EMOM Profiler to be used as a part of a program where the specific objective is "to educate students at the community college and high school level in microsystems", says Al West of CNM.