Americas Corporation announced the introduction of the Ultima
IV X-ray diffractometer, an advanced general purpose X-ray diffraction
(XRD) instrument for materials science, semiconductor, and
nanotechnology research and development as well as quality assurance
for the manufacturing environment. The design features a new high speed
detector for 100X faster measurements, unrivaled application
flexibility provided by patented Cross Beam Optics (CBO), and a 50%
smaller size than a conventional XRD system.
Innovative by design, a fully optioned Rigaku Ultima IV can
span applications that would have required up to four separate
conventional XRD instruments in the past. A modular 'build-up' platform
allows users to add additional capabilities as a new application
requirements arise, including support for high resolution diffraction,
thin film measurement, micro diffraction, and handling very small
The Ultima IV is equipped with a unique and patented (US
6,807,251) Cross Beam Optics (CBO) mechanism that allows user
selectable switching between either a focusing or parallel incident
X-ray beam without resetting or realigning the optical system. Both
system geometries are permanently mounted and permanently aligned to
allow easy changeover for different applications. All other competitive
x-ray diffraction systems require system reconfiguration when switching
operation of the system between focusing and parallel beam geometries.
In addition, new optics for micro diffraction provides data quality
close to that provided by a dedicated microdiffraction system.
The new Ultima IV is also must more efficient that a
conventional XRD instrument, occupying 50% less space and having 20%
less mass. A reduce footprint means lower facilities overhead for a
reduced cost-of-ownership (COO). In addition, the sample stage height
is 300 mm lower than a conventional XRD system for ease-of-use. Ultima
IV measures: 1100 mm W x 810 mm D x 1630 mm H.