Carl Zeiss SMT, a leading global
provider of electron- and ion-beam imaging and analysis equipment, last
night was honoured with a coveted R&D 100 Award for one of the
100 most technologically significant new products in 2007. R&D
Magazine recognized Carl Zeiss SMT's newest Scanning Transmission
Electron Microscope (STEM) for its ability to advance the field of
materials science and research.
Using a unique combination of design features, this powerful,
advanced version of the Carl Zeiss LIBRA 200 STEM enables scientists
and researchers to analyze materials at the atomic level.
Nanostructures can be viewed with imaging resolutions and analytical
capabilities never before possible in one single instrument.
The 45th annual technology competition run by R&D
Magazine evaluated entries from various companies and industry players,
research organizations and universities around the world. The
magazine's editors and a panel of outside experts served as judges,
evaluating each entry in terms of its importance to the world of
science and research.
According to Tim Studt, editor-in-chief of R&D
Magazine, "winning an R&D 100 Award provides a mark of
excellence known to industry, government, and academia as proof that
the product is one of the most innovative ideas of the year. Our
congratulations go out to Carl Zeiss SMT, an organization that is
clearly a global leader in the creation of technology-based products
that make a difference in how we live and work."
Daniel McGee, vice president sales and service for Carl Zeiss
SMT, said, "Enabling the Nano-Age World is our purpose at Carl Zeiss
SMT - a purpose that shapes everything we do. Having our efforts
recognized by an industry-leading technical journal like R&D
Magazine is a great honour for our organization and its efforts in
fulfilling our commitment."
The awards presentation took place at Chicago's Navy Pier, and
featured a public exhibition where the winning technologies could be
examined and explored. Following an evening reception and awards
dinner, the awards were presented during a formal ceremony.