NanoSight Limited,
the nanoparticle characterization company, has announced significant software
advances for their family of instrumentation. New software versions usually
offer fixes to problems and slight tweaks to existing routines in response to
user requests. These advances provide particular benefits to users to improve
the validity of their measurements.
Extended Analysis answers two key questions for users of NTA (Nanoparticle
Tracking Analysis): How long should a user run an analysis and how many particles
does the user need to measure to get a statistically good result? The two are
interdependent: the longer the analysis time, the more particles are counted,
as the contents of the interrogated volume self-refresh through diffusion. NTA
2.0 now analyses particles as they are detected, eliminating the need to record
for post experiment analysis thus speeding use and repeatability. Users may
now run analyses far longer and improve the development of the optimal analysis
time.
Extended Dynamic Range is achieved through the interleaving of alternate video
frames at high and then low gain settings will help users track large and small
particles in the same sample, thus greatly increasing dynamic range. For example,
four clear peaks are readily observed for a mix of latex reference particles
of 50, 200, 400 and 590nm.
The 3D Diameter Scatter Plot shows diameter plotted against scatter intensity
to both boost resolution and provide a capability to differentiate similar sized
particles when they are of differing materials. In these analyses, a third axis
plots scatter intensity against the existing particle size distribution of number
count vs. size. In the figure shown, the analysis allows the presence of dimer
particles to be seen and contrasted to slightly larger but significantly brighter
particles.
The last new benefit is derived from Model-Fitting. This enhancement compensates
for the natural broadening of displayed results. This broadening is inherent
in the stochastic nature of Brownian motion and the physical limitation of only
being able to track particles for a finite number of frames. Model-Fitting works
by compensating for the number of tracks (consecutive jumps, frame to frame)
used in the NTA analysis. This effectively compensates for the Gaussian breadth
of the curve where its origin is understood. Users are able to apply this feature
to specific peaks displayed in the particle size analysis. The background to
this development was described by Professor Paul Van der Meeren in his presentation
at the PSA 2008 conference held in Stratford-upon-Avon.
While current users will benefit from these developments through receiving
a free upgrade, these and other routines have been introduced with all new systems
at no increased charge reflecting NanoSight’s commitment to be at the
leading edge in instrumentation for nanoparticle characterization.
For more information about NanoSight and how their instrumentation is applied
to applications in both the biological and materials sciences, please visit
www.nanosight.co.uk.