Keithley Instruments, Inc.
(NYSE: KEI), a world leader in advanced electrical test instruments and
systems, will broadcast a free, web-based seminar titled "Hall Effect Measurements
Fundamentals" on Thursday, February 19, 2009. This one-hour seminar will
introduce the topic of Hall Effect measurements as they relate to semiconductor
materials and device characterization. To register for this event, visit www.keithley.com/events/semconfs/webseminars.
Hall Effect measurement systems are commonly used to determine semiconductor
parameters, such as carrier mobility and carrier concentration, Hall coefficient,
and conductivity and conductivity type. Seminar participants will learn what
Hall Effect measurements are, who can use them, what industry trends are driving
the need for them, and what key equipment considerations are involved in configuring
Hall Effect measurement systems. The event will conclude with a text-based Q&A
This seminar is recommended for engineers and materials scientists developing
thin films for solar/photovoltaic applications, as well as for those new to
semiconductor materials and testing, anyone working with compound semiconductor
materials, and characterization lab managers.
Steven Weinzierl, Keithley's applications engineering manager, will present
the seminar. Weinzierl holds a Ph.D. from Cornell University and has more than
15 years of semiconductor industry experience. He has published more than 30
refereed journal articles and conference papers and has been awarded one patent.
Hall Effect Measurements Fundamentals will be broadcast on February 19, 2009
at 3:00 p.m. Central European Time (9:00 a.m. EST) for the European audience
and at 2:00 p.m. EST (8:00 p.m. Central European Time) for the North American
audience. The event is free to the public, but advanced registration is required
at www.keithley.com/events/semconfs/webseminars. The seminar will also be archived
on Keithley's website for those unable to attend the original broadcast.