Home
Home
Articles
News
Directory
Equipment
Experts
Classifieds
Books
News
Atomic Force Microscopes
Bionanotechnology
Carbon Nanotubes
Control Systems
Data Loggers
Dendrimers
Fullerenes
Graphene
Lab on a Chip
MEMS - NEMS
Microscopy
Nanoanalysis
Nanobusiness
Nanoelectronics
Nanoenergy
Nanoethics
Nanofabrication
Nanofluidics
Nanoindentation
Nanolithography
Nanomagnetics
Nanomaterials
Nanomedicine
Nanooptics and Nanophotonics
Nanoregulations
Nanosensors
Nanotoxicology
Quantum Dots
Articles
Latest Articles
Thought Leaders
Commercializing Nanotechnology
AZojono - Journal of Nanotechnology
Global Market Reports
Materials
Suppliers A to Z
Applications
Industries
Equipment
Aerosol Coating Equipment
AFM Tips, Probes, Cantilevers
Atom Probes
Atomic Emission Spectrometers
Atomic Force Microscopes (AFM)
Atomic Layer Deposition (ALD) Systems
Biomedical Atomic Force Microscopes (bio-AFM)
Calorimeters
Carrier Concentration Profiler
Control Systems
Cryogenic Probe Stations
Data Loggers
Dynamic Light Scattering Instruments
Electrical Conductivity Measurement Systems
Electron Backscattered Diffraction (EBSD) Systems
Ellipsometers
Energy Dispersive X-Ray Spectroscopy (EDS)
Flow Chemistry Reactors
Focused Ion Beam (FIB) Accessories
Focused Ion Beam (FIB) Systems
FT-IR and FT-NIR Spectrometers
Helium Ion Beam Microscopes (HIM)
Induction Heating
Micro Hardness Testers
Microfluidic Devices
Micropositioning Systems
Mills for Reducing Particle Size
Moisture Analyzers
Nanofiber Production Equipment
Nanoimprint Lithography Equipment
Nanoimprint Lithography Templates
Nanoindentation Testers
Nanolithography Systems
Nanoparticle Characterization Systems
Nanoparticle Production Systems
Nanopositioning Systems
Optical Characterization Systems
Optical Tweezers
Particle Size Analyzers
Photoluminescence Mapper
Piezo Actuators
Plasma Cleaning Systems
Plasma Etching Systems
Profilometers
Raman Spectrometers
Sample Preparation Equipment
Scanning Electron Microscope (SEM) Accessories
Scanning Electron Microscopes (SEM)
Scanning Near-Field Optical Microscopes (SNOM)
Scanning Probe Microscopes (SPM)
Scratch Testers
Separation Membranes
Spectrofluorometers
Spectrometers
Spectrophotometers
Spectroscopic Ellipsometers
Sputtering Systems
Streak Cameras
Surface Area Analyzers
TEM Sample Holders and Supplies
Thermal Analysis Equipment
Thermal Desorption Equipment
Thin Film and Coating Thickness Measurement Tools
Thin-Film Deposition Systems
Time Delay Inegration (TDI) Cameras
Transmission Electron Microscopes
Tribometers - Friction and Wear Testers
Ultrasonic Processing Equipment
Vibration Isolation Systems
Wafer Bonders
X-Ray Cameras
X-Ray Diffractometers
X-Ray Fluorescence Analyzers
Zeta Potential Analyzers
Classifieds
Books
Bionanotechnology
Carbon Nanotubes
Dendrimers
Fullerenes
MEMS - NEMS
Microscopy
Nanodevices
Nanoelectronics
Nanoenergy
Nanolithography
Nanomaterials
Nanomedicine
Nanotechnology
Nanotoxicology
Quantum Dots
Journals
Nanoelectronics
Nanoethics
Nanofabrication and Processing Technologies
Nanofluidics
Nanomagnetics
Nanomaterials
Nanomedicine
Nanooptics
Nanosensors
Nanotechnology
Quantum Physics
Spectroscopy
Videos
Atomic Force Microscopes
Graphene
ICONN 2010 Interviews
Lab on a Chip
Microfluidics - Devices and Systems
MRS 2008 Fall Meeting Video Interviews
MRS 2010 Fall Meeting Video Interviews
MRS 2011 Fall Meeting Video Interviews
MRS 2012 Fall Meeting Video Interviews
Nanoanalysis
NanoArt
Nanomanipulation
Nanomaterials
Nanooptics and Nanophotonics
Nanosensors
Nanotechnology and the Environment
Nanotechnology Applications
Nanotechnology in Aerospace
Nanotechnology in Energy
Nanotechnology in Medicine
Nanotechnology in Semiconductors
Nanotechnology Overviews
Nanotubes
Pittcon 2009 Video Interviews
Pittcon 2012 Interviews
Self Assembly
X-Ray Diffraction
Courses
Courses
Events
About
Contact
Meet the Team
Help/FAQs
Terms
Search
Advertise
May 22, 2013
Browse by:
Materials
|
Applications
|
Industries
About
Advertise
Terms
Site Sponsors
Latest Nano News
Attensity to Showcase at Digitizing The Planet Event
Nanochemistry Part of Student Physical Chemistry Graduate Frontier Forum
Cascade Microtech to Showcase Newest Wafer Probing Solutions
Toshiba Develops 19 nm Process for Mass Production of 2-bit-per-cell 64 Gigabit NAND Memory Chips
Robust New Method for Arranging Metal Nanoparticles in Geometric Patterns for Optical Processing
Site Sponsors
Search
Request for Quote (RFQ): If you'd like us to help you source a Quotation for any particular products or from any suppliers, please
click here
. Once submitted, we will try and place you in contact with a suitable supplier within 48 hours.
Videos
Experts
Journals
Courses
Events
Classifieds
Search is Loading...
All
News
Articles
Suppliers
Equipment
Books
More
Results
1
-
10
of
31
for
3714
.
Search
Next>
MEMS - Micro Electromechanical Systems and Their Applications Explained and Defined
Micro Electro Mechanical Systems, or MEMS, are simply extremely small machines or electronic devices.
http://www.azonano.com/article.aspx?ArticleID=1763
|
13 Oct 2006
Automotive Applications for Nanomaterials - Supplier Data by Strem Chemicals
Nanomaterials have several potential applications in the automotive industry. These include exhaust catalysts, shock absorbers and coolants. These applications are explored others listed.
http://www.azonano.com/article.aspx?ArticleID=1328
|
27 Jul 2005
GM’s 2005 Hummer H2 Features Nanocomposite Components - News Item
The 2005 Hummer H2 SUT is the latest vehicle in General Motors Corp.’s line-up to benefit from a lightweight, high performance nanocomposite material. Posted May 13 2004
http://www.azonano.com/article.aspx?ArticleID=1017
|
26 Jul 2004
Altair Nanotechnologies Batteries Exceed Expectations - News Item
Development work on nanosized lithiated titania has found that it is able to charge and discharge at rates that are orders of magnitude higher than more conventional material. This behaviour makes it...
http://www.azonano.com/article.aspx?ArticleID=79
|
5 Nov 2003
Nanoscale Thermal Analysis of Automobile Coatings Using nano-TA Thermal Probe from Anasys Instruments
The nano-TA from Anasys Instruments adds a new and valuable capability of spatially resolved thermal analysis to the AFM. It is particularly useful for thin films. This article looks at the analysis...
http://www.azonano.com/article.aspx?ArticleID=2066
|
18 Feb 2008
Nanomaterial Surface Analysis and Metrology Using Equipment and Expertise from CEMMNT
The Centre of Excellence in Metrology for Micro and Nano Technologies (CEMMNT) provides access to equipment and expertise to accelerate nanomaterials commercialisation. This article highlights...
http://www.azonano.com/article.aspx?ArticleID=2054
|
5 Feb 2008
Automotive Component Characterisation by Surface Analysis and Measurement Using Equipment and Expertise from CEMMNT
The Centre of Excellence in Metrology for Micro and Nano Technologies uses state of the art surface analysis equipment and expertise to address a wide range of applications in the automotive industry...
http://www.azonano.com/article.aspx?ArticleID=2053
|
5 Feb 2008
Microscale and Nanoscale Measurement and Characterisation for the Acceleration of Product Commercialisation Using Nanotechnology Expertise and Equipment from CEMMNT
The Centre of Excellence in Metrology for Micro and Nano Technologies (CEMMNT) provides access to nanotechnology equipment and expertise to accelerate product commercialisation
http://www.azonano.com/article.aspx?ArticleID=2052
|
5 Feb 2008
Precision Technologies CIC – Measurement, Understanding and Optimisation
Experts at the Precision Precision Technologies CIC use the latest technologies, processes and equipment in our advanced Nanolab to help UK and international manufacturing companies to use...
http://www.azonano.com/article.aspx?ArticleID=1928
|
21 Jun 2007
Carbon Emission Reduction and The Areas In Which Nanotechnology Can Positively Effect Climate Change and Global Warming
One of the most pressing environmental issues facing modern society is that of global warming and the reduction of greenhouse gases in the environment. Nanotechnology can be applied to a number of...
http://www.azonano.com/article.aspx?ArticleID=1913
|
31 May 2007
Result Page
1
2
3
4
Next