MEMSCAP, the MEMS leader, provides innovative products and solutions based on micro-electromechanical systems, or MEMS. The company enables its customers in high-growth markets to incorporate...
CYRIUM Technologies, a venture backed company, is developing a proprietary breakthrough photovoltaic solar cell technology using semiconductor NanoTechnology. Our cells increase photovoltaic solar...
The Pyrogenics Group is the technological leader in the production of very specialized, high-purity carbon products with unique thermal, electrical, physical and chemical properties that have...
Strem Chemicals, Inc. established in 1964, is a privately-held company that manufactures and markets specialty chemicals of high purity. Its clients include academic, industrial and government...
As Scanning Probe Microscopes (SPM) and Atomic Force Microscopes (AFM) are still evolving, manufacturers are keen to protect their work by patenting many of the design changes. Which companies hold...
http://www.azonano.com/article.aspx?ArticleID=1374 | 24 Aug 2005
Carrying out experiments in microgravity conditions is helping researchers to advance knowledge about nanotechnology. This article studies the formation of nanoparticles in gaseous phase reactions and...
http://www.azonano.com/article.aspx?ArticleID=1127 | 3 Mar 2005
Surface-enhanced Raman spectroscopy (SERS) is a technique allowing greatly increased Raman signals used for trace detection and characterization of biological specimens with extremely high spatial...
http://www.azonano.com/article.aspx?ArticleID=1993 | 3 Oct 2007
This article examines the use of various NTEGRA products from NT-MDT for overcoming the short comings or failures of straight scanning probe microscopy
http://www.azonano.com/article.aspx?ArticleID=2048 | 21 Jan 2008
This article investigates the materials testing methods of Nanoindentation, Sclerometry and Nanoscratching
http://www.azonano.com/article.aspx?ArticleID=2047 | 21 Jan 2008
Human Cell, Tissue, and Cellular and Tissue-Based products particle monitoring requirements are outlined in this article and solutions given using Particle Counters from Particle Measuring Systems
http://www.azonano.com/article.aspx?ArticleID=2020 | 5 Nov 2007