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Ultrafast and Ultrasensitive Acquisition of 3D Confocal Raman Imaging using alpha 300R- Application Note by WITec
By integrating a Raman spectrometer within a state-of-the-art confocal microscope setup, Raman imaging with a spatial resolution down to 200 nm laterally and 500 nm vertically can be achieved using...
http://www.azonano.com/article.aspx?ArticleID=2793
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2 Mar 2011
Simultaneous DCS-SWAXS of DPPC in Water with the S3-MICROcaliX from Hecus
In the following application note we present the results of DSC/SWAX measurements of a model membrane phospholipid DPPC (dipalmitoyl-phosphatidylcholine) in water (20%) performed with the...
http://www.azonano.com/article.aspx?ArticleID=2785
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28 Jan 2011
Simultaneous DCS-SWAXS of Silver-Behenate Powder with the S3-MICROcaliX from Hecus
In the following application note we present the results of DSC/SWAX measurements of dry silver-behenate powder performed with the S3-MICROcaliX in a heating-scan. This dry powder exhibits a lamellar...
http://www.azonano.com/article.aspx?ArticleID=2784
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27 Jan 2011
Technological Advances in Small Angle X-Ray Scattering by Hecus
The paradigm of material science in the 20th century was that X-ray crystallography provides the ultimate answer for structure. Today, the most burning questions in nano-structural chemistry and...
http://www.azonano.com/article.aspx?ArticleID=2722
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17 Nov 2010
Small Angle X-Ray Scattering of Pharmaceutical Drugs by Hecus
In pharmaceutical industry, analytical innovations are just as important as the development of new products. Just consider the crucial roles played by chromatographic (e.g. HPLC, FPLC), spectroscopic...
http://www.azonano.com/article.aspx?ArticleID=2721
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17 Nov 2010
Focused Ion Beam (FIB) Microscope - Automated Gas Chemistry in Focused Ion Beam (FIB) Microscope by Omniprobe
Gas chemistries in the Focused Ion Beam (FIB) microscope play an important role in semiconductor metrology and process control. In the FIB in-situ lift-out process, gas-assisted etching speeds the...
http://www.azonano.com/article.aspx?ArticleID=2706
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14 Oct 2010
Focused Ion Beam (FIB) Microscope - Nanomechanical Characterization in the Focused Ion Beam Microscope by Omniprobe
The availability of the Focused Ion Beam (FIB) microscope with its excellent imaging resolution, depth of focus and ion milling capability have made it an appealing platform for materials...
http://www.azonano.com/article.aspx?ArticleID=2705
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13 Oct 2010
Different Optical, AFM and Spectroscopy Techniques Provide Unique Opportunities for Investigation of Graphene by NT-MDT
Combination of Atomic Force Microscopy (AFM), Raman / Fluorescence / Rayleigh microscopy and Scanning Near-Field Optical Microscopy (SNOM) provides unique opportunities for Graphene investigation.
http://www.azonano.com/article.aspx?ArticleID=2616
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12 Jun 2010
Scanning Thermal Microscopy (SThM) - The Nanoscale Thermometer and Heater
Scanning Thermal Microscopy (SThM) is an advanced Scanning Probe Microscopy technique that is useful for obtaining nanoscale thermal properties and topographical images.
http://www.azonano.com/article.aspx?ArticleID=2606
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27 May 2010
Nanolithography - The "Pen and Ink" of Nanotechnology
Fabricating devices at the nanoscale is one of the leading challenges for nanotechnology research as it underpins the future commercialization of many nanotechnology-enabled devices.
http://www.azonano.com/article.aspx?ArticleID=2605
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26 May 2010
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