Angstrom Engineering was founded in 1992 and has quickly grown into a global company with a reputation for providing high-quality machines and unparalleled customer service. Our PVD equipment is...
News - 12 Jun 2014
PROFIT & Canadian Business today ranked Angstrom Engineering Inc. No. 427 overall and No. 193 in the Industrial Business category on the 26th annual PROFIT 500 ranking of Canada’s...
Article - 20 Nov 2012
Massachusetts has many organisations committed to promoting nanotechnology as well as exploring the future prospects of nanotechnology. A brief introduction to the key nanotechnology-related...
News - 22 Oct 2008
Ambios Technology, Inc.
introduced its new Q-View White Light Interferometer / SPM system at the Twenty-Third
Annual Meeting of the American Society for Precision Engineering in Portland,...
News - 27 Apr 2007
nCoat, Inc. ("nCoat" or the "Company") provided information concerning the focus of development of their nanotechnology products, processes and chemistries. nCoat develops,...
News - 29 Jun 2015
Angstron Materials Inc., today announced the appointment of Ian Fuller as vice president for business development and engineering. The Bellbrook, Ohio resident was promoted to the position to fast...
News - 18 Jun 2012
Thermo Fisher Scientific Inc., the world leader in serving science, expanded its portfolio of Thermo Scientific Accucore columns with a range of columns for biomolecule separations.
News - 7 Sep 2009
Zemetrics, an optical
metrology product company founded last year to provide new concept surface metrology
systems, has brought its first system, ZeMapper, to the precision engineering
News - 25 Jan 2008
Mass metrology innovators, Metryx
Limited, today announced the receipt of a multiple system
follow-on order from Taiwanese semiconductor memory manufacturer, Inotera
Memories, Inc. The order is for...
News - 21 Aug 2007
Veeco Instruments Inc., today announced the release of its latest generation of industry-leading SP products for backend semiconductor metrology. The Wyko(R) SP9900(TM) Surface Profiling System...