Article - 22 Aug 2013
Measuring and mapping mechanical properties of live cells is crucial in today's biological research. Although atomic force microscopy is mainly used to produce a 3D profile of the scanned surface, it...
News - 8 Feb 2012
Bruker announced today the call for papers for the 'Seeing at the Nanoscale 2012' conference, which will take place at the Wills Memorial Building, University of Bristol, UK, from July 09-11,...
Article - 11 Dec 2012
Opportunities for national and international trade and collaborations with the large number of nanoscience research facilities make California an important global player in nanotechnology, as well as...
Article - 7 Mar 2013
In AFM, a sharp tip is held at close proximity with a sample using a force-based feedback loop.
Article - 18 May 2012
Atomic force microscopy (AFM) is a technique used to characterize surfaces at extremely high resolution by scanning a sharp probe across the surface.
News - 7 Apr 2015
Bruker Corporation today announced an official partnership with the University of Manchester’s National Graphene Institute (NGI), joining a select list of industrial collaborators.
News - 9 Aug 2011
The Bruker Nano Surfaces division has launched a brand new website for atomic force microscopy (AFM) probes at www.brukerAFMprobes.com.
Bruker, the company that has recently brought you Dimension...
Article - 20 Jul 2012
Dr Mark Munch, President of Bruker Nano Surfaces, talks about the
challenges and opportunities for AFM research at the Seeing at the
Nanoscale event in Bristol.
Article - 20 Jun 2012
There are three key application areas that benefit from a high-bandwidth Atomic Force Microscope(AFM) with identical data quality, operating cost, force control and convenience of use as a typical...
Article - 21 May 2012
PeakForce Tapping (PFT) and ScanAsyst (SA) are two Atomic Force Microsocope (AFM) imaging techniques recently introduced by Bruker which fits into the framework of existing AFM modes.